a Cu ≤ 0.50 %; Ni ≤ 0.50 %; Cr ≤ 0.50 % kanye ne-Mo ≤ 0.15 %.

b Ekunciphiseni ngakunye ngo-0.01 % ngaphansi kwesilinganiso esiphezulu esibekiwe sekhabhoni, ukunyuka ngo-0.05 % ngaphezu kwesilinganiso esiphezulu esishiwo ku-Mn kuvumelekile, kuze kufike ku-1.65 % kumabanga ≥ L245 noma B, kodwa ≤ L360 noma X52; kuze kufike ku-1.75 % kumabanga > L360 noma X52, kodwa <L485 noma X70; futhi kuze kufike ku-2.00 % weBanga L485 noma X70.

c Ngaphandle uma kuvunyelwene ngenye indlela, Nb + V ≤ 0.06 %.

d Nb + V + Ti ≤ 0.15 %.

e Ngaphandle uma kuvunyelwene ngenye indlela.

f Ngaphandle kwalapho kuvunyelwene ngenye indlela, Nb + V + Ti ≤ 0.15 %.

g Akukho ukwengeza ngamabomu kuka-B okuvunyelwe futhi okusele okungu-B ≤ 0.001 %.

Ibanga lePipe

lapho

C unyaka ka-1940 wokubala kusetshenziswa amayunithi e-SI kanye nezi-625,000 zokubala kusetshenziswa amayunithi e-USC;

AI-xc iyindawo esebenzayo yokuhlola i-tensile test piece, evezwa ngamamilimitha ayisikwele (amayintshi ayisikwele), kanjena:

I-1) ngezingcezu zokuhlola eziyisiyingi, i-130 mm2 (0.20 in.2) ye-12.7 mm (0.500 in.) kanye no-8.9 mm (0.350 in.) izingcezu zokuhlola ububanzi; 65 mm2 (0.10 in.2) ngo-6.4 mm (0.250 in.) izingcezu zokuhlola ububanzi;

2) ngezingcezu zokuhlola ezigcwele, okungaphansi kuka-a) 485 mm2 (0.75 in.2) kanye b) nendawo enqamula ingxenye yocezu lokuhlola, oluthathwe kusetshenziswa ububanzi obushiwo bangaphandle kanye nobukhulu bodonga obushiwo bepayipi, ukuzungeza ku-10 mm2 eseduze (0.01 ku-2);

3) izingcezu zokuhlolwa kwe-strip, okungaphansi kuka-a) 485 mm2 (0.75 in.2) kanye b) nendawo enqamula ingxenye yesiqeshana sokuhlola, etholakala kusetshenziswa ububanzi obubekiwe besiqephu sokuhlola kanye nobukhulu bodonga obucacisiwe bepayipi. , izungezwe ku-10 mm2 eseduze (0.01 ku-2);

U amandla okuqina amancane ashiwo, avezwa ngama-megapascals (amaphawundi ngeyintshi yesikwele).